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The Toshiba Semiconductor and Storage 2SK3309(TE24L,Q) is a silicon N-channel MOS field-effect transistor utilizing π-MOSV technology. It features a drain-source voltage rating of 450 V, a continuous DC drain current of 10 A, and a pulse drain current of 40 A. The device exhibits a typical drain-source ON resistance of 0.48 Ω at VGS = 10 V and ID = 5 A, with a maximum forward transfer admittance of 4.3 S. It operates within a channel temperature range up to 150 °C and includes avalanche energy ratings of 222 mJ (single pulse) and 6.5 mJ (repetitive).
Verify the TE24L,Q suffix against official Toshiba documentation to confirm specific tape-and-reel packaging or automotive-grade qualification requirements. Ensure compliance with RoHS directives and export control regulations applicable to your region before procurement.
Select this component for high-voltage switching applications requiring moderate current handling. Evaluate thermal management based on the 1.92 °C/W junction-to-case thermal resistance. Confirm that the 450 V breakdown voltage aligns with system transient requirements and that the 10 A continuous current rating meets load demands.
This part belongs to Toshiba's silicon N-channel MOSFET portfolio designed for industrial and general-purpose switching. It is packaged in a JEDEC-standard TO-220AB format, suitable for through-hole mounting. The device is intended for use in environments where standard reliability standards apply, excluding unintended high-risk applications.
Consult official Toshiba substitution guides for verified equivalents. Cross-reference absolute maximum ratings, specifically the 450 V drain-source voltage and 10 A continuous current limits, to ensure functional compatibility in existing designs.
The 2SK3309 supports a single-pulse avalanche energy (EAS) of 222 mJ under specified test conditions.
The gate threshold voltage (Vth) ranges from 3.0 V to 5.0 V when measured at VDS = 10 V and ID = 1 mA.