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The Toshiba Semiconductor and Storage 2SK3868(Q,M) is a silicon N-channel MOS type field effect transistor utilizing π-MOSVI technology. It features a drain-source voltage rating of 500 V and a continuous DC drain current capacity of 5 A at a case temperature of 25°C. The device exhibits a typical drain-source ON resistance of 1.3 Ω at a gate-source voltage of 10 V and a drain current of 2.5 A. Its forward transfer admittance typically reaches 3 S under identical conditions. The component supports a maximum channel temperature of 150°C and includes avalanche energy ratings of 180 mJ for single pulses.
Verify the specific ordering suffix (Q or M) against official Toshiba documentation to confirm environmental compliance status, such as RoHS compatibility. Confirm package markings and lot number formatting requirements before finalizing procurement specifications.
Select this component for designs requiring a 500 V N-channel MOSFET with moderate current handling capabilities. Ensure thermal management strategies account for the specified thermal resistance values to maintain the channel temperature within the 150°C limit during continuous operation.
This part belongs to the Toshiba π-MOSVI series of silicon N-channel MOS type field effect transistors. These devices are engineered for general electronics applications, including computers, office equipment, measuring instruments, and home appliances, while excluding unintended uses like automotive or medical systems.
Publicly confirmed substitute part numbers are not available in the provided source material.
The repetitive avalanche energy (EAR) rating is 3.5 mJ.
The datasheet provides a graph showing the relationship between gate threshold voltage and case temperature, indicating that the threshold voltage decreases as the case temperature increases.