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The AO6404 is a 20V N-Channel Enhancement Mode Field Effect Transistor manufactured by Alpha & Omega Semiconductor. It utilizes advanced trench technology to deliver excellent RDS(ON) and low gate charge, supporting operation with gate voltages as low as 1.8V while maintaining a 12V VGS(MAX) rating. The device features a continuous drain current of 8.6A at VGS=10V. On-state resistance values are less than 17mΩ at VGS=10V, less than 18mΩ at VGS=4.5V, less than 24mΩ at VGS=2.5V, and less than 33mΩ at VGS=1.8V. It includes an ESD rating of 2000V HBM and undergoes 100% UIS and Rg testing.
Verify the specific ordering suffix against official Alpha & Omega Semiconductor documentation to confirm package type and tape/reel specifications. Ensure compliance requirements such as RoHS and Halogen-Free status match project constraints. Confirm that the TSOP6 package dimensions align with the target PCB footprint before finalizing procurement orders.
Select this component when low gate drive voltage capability down to 1.8V is required alongside high current handling. The low on-resistance across various gate voltages makes it suitable for battery-powered systems. Verify thermal management needs based on the junction-to-ambient thermal resistance in the specific application environment.
This part belongs to the Alpha & Omega Semiconductor MOSFET family, specifically designed for general-purpose switching applications. It is housed in a TSOP6 surface-mount package, offering a compact solution for space-constrained designs. The device is electrically characterized for use in environments requiring robust unclamped inductive switching performance.
Consult official manufacturer substitution guides for verified equivalents. Cross-referencing requires matching voltage ratings, current capabilities, package types, and electrical characteristics to ensure functional compatibility without circuit modification.
The AO6404 supports operation with gate voltages as low as 1.8V.
Yes, the AO6404 undergoes 100% Unclamped Inductive Switching (UIS) testing.