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AOTF266L is listed in the Single FETs, MOSFETs range at ChipApex. The manufacturer field lists Alpha & Omega Semiconductor Inc.. Its product description is MOSFET N-CH 60V 18A/78A TO220-3F. Review the specifications below when checking this part for your BOM.
The AOTF266L is a 60V N-Channel MOSFET utilizing Trench technology, packaged in TO-220F. It features a continuous drain current of 78A at TC=25°C and a maximum junction-to-case thermal resistance of 3.3°C/W. The device exhibits an on-resistance of less than 3.2mΩ at VGS=10V and ID=20A, or less than 3.8mΩ at VGS=6V and ID=20A. Total gate charge is 90nC at VGS=10V. It supports a pulsed drain current of 450A and has been subjected to 100% UIS and Rg testing.
Verify the specific ordering suffix against official Alpha & Omega Semiconductor documentation to confirm package type and reel specifications. Ensure compatibility with intended PCB footprint and thermal management requirements before procurement. Confirm component status as active or obsolete through authorized distributors.
Select this component for designs requiring high current handling in a through-hole TO-220F package. Evaluate thermal dissipation capabilities based on the 3.3°C/W junction-to-case resistance. Consider the low gate charge for driving efficiency in high-speed switching circuits compared to standard MOSFETs.
This part belongs to the AOT266L/AOB266L/AOTF266L family of 60V N-Channel MOSFETs from Alpha & Omega Semiconductor. The series utilizes advanced trench technology to achieve superior electrical characteristics suitable for modern power conversion architectures.
Direct substitutes include AOT266L (TO-220) and AOB266L (TO-263/D2PAK). Verify pinout compatibility and thermal resistance differences when replacing with surface mount variants.
The maximum junction temperature is 175°C, although ratings are often calculated based on a maximum allowed junction temperature of 150°C for standard applications.
Yes, the datasheet confirms that the device undergoes 100% Unclamped Inductive Switching (UIS) testing.
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