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BSB019N03LX G is listed in the Single FETs, MOSFETs range at ChipApex. The manufacturer field lists Infineon Technologies. Its product description is MOSFET N-CH 30V 32A/174A 2WDSON. Review the specifications below when checking this part for your BOM.
The BSB019N03LX G is an N-channel Power MOSFET from Infineon Technologies, utilizing OptiMOS technology. It features a drain-source voltage (VDS) of 30 V and a maximum on-resistance (RDS(on)) of 19 mΩ at 10 V gate drive. The device supports a continuous drain current of 32 A at 25°C case temperature and up to 174 A at case temperature. It is housed in a surface-mount MG-WDSON-2 package, also known as CanPAK M™, designed for efficient thermal management and high power density in compact electronic designs.
Verify the component status carefully, as some sources indicate this specific part number may be obsolete or end-of-life. Confirm availability through authorized distributors and check for valid RoHS compliance documentation. Ensure the ordering suffix matches the required package variant and ensure compatibility with your manufacturing process before placing orders.
Select this component when a 30 V rating is sufficient and low RDS(on) is critical for efficiency. The MG-WDSON-2 package offers a balance between thermal performance and board space. Compare total system cost against alternative packages like D2PAK if higher current ratings are needed, considering the trade-off between footprint and thermal resistance.
This device belongs to Infineon's OptiMOS family, which integrates advanced trench gate technology to minimize gate charge and on-resistance. It is designed for general-purpose power switching applications where high efficiency and reliability are required. The CanPAK M™ package provides superior thermal dissipation compared to standard small-outline packages.
Check for direct pin-compatible alternatives within the same 30 V, ~20 mΩ category. Verify that any substitute maintains similar thermal characteristics and gate charge specifications to ensure circuit stability without redesign.
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