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— IC芯片 | 连接器 | 传感器 | 被动器件 —
The IRG4CC30FB is a silicon IGBT die in wafer form, rated for 600V collector-emitter breakdown voltage. It features a nominal backmetal composition of Cr-Ni and V-Ag (1 kA-2kA-2.5kA) with a front metal layer of 99% Al and 1% Si (4 microns). The die dimensions are 0.141 inches by 0.164 inches. Electrical characteristics include a maximum collector-to-emitter saturation voltage of 1.7V at 6A and 25°C, and a gate threshold voltage range of 3.0V to 6.0V.
Verify that the supplier provides the component strictly as bare die on a 6-inch wafer with a standard flat. Confirm the specific lot meets the recommended storage environment requirements, including dessicated nitrogen conditions. Ensure the ordering documentation explicitly identifies the part as wafer form rather than packaged discrete components.
Select this component when designing custom power modules requiring a 600V IGBT die. The IRG4CC30FB serves as the bare die equivalent to the IRG4BC30F packaged part. Designers must account for the specific die attach temperature limits not exceeding 300°C and ensure proper thermal management for the 0.141 x 0.164 inch footprint.
This component belongs to Infineon's (formerly International Rectifier) 600V IGBT family. It represents the wafer-level version of the IRG4BC30F discrete device. The product utilizes trench technology optimized for high-speed switching applications, providing a standardized building block for manufacturers creating proprietary power electronics assemblies.
The IRG4BC30F is the direct packaged reference part for design purposes. Other dies from the same 600V series may be considered if electrical parameters match the application requirements.