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The IRG4PH30KD is a single N-channel Insulated Gate Bipolar Transistor (IGBT) co-packaged with an ultrafast soft recovery antiparallel diode. It features a collector-emitter breakdown voltage of 1200 V and a continuous collector current rating of 20 A at 25°C. The device utilizes the fourth-generation IGBT technology to achieve low conduction losses, with a typical saturation voltage of 3.1 V at 15 V gate drive and 10 A collector current. It is housed in a TO-247AC package.
Verify the specific ordering suffix against the manufacturer's official documentation to confirm compliance status and packaging details. Ensure the component matches the required thermal and electrical specifications for the target application before procurement.
Select this component for designs requiring robust short-circuit capability and reduced electromagnetic interference. The integrated diode simplifies circuit topology by eliminating the need for external freewheeling diodes in certain configurations.
This part belongs to the IRG4P series from Infineon Technologies, representing a generation of IGBTs designed for high-performance industrial applications. It serves as a successor to previous generations like the IRGPH30MD2, offering tighter parameter distributions and higher efficiency.
Official documentation indicates that this part replaces the IRGPH30MD2 product. Verify pinout compatibility and thermal characteristics when substituting legacy components.
The device is optimized for motor control with a short-circuit rating of 10 µs at a collector voltage of 720 V and junction temperature of 125°C.
Yes, it is co-packaged with a HEXFRED ultrafast, ultrasoft recovery antiparallel diode.