SCANPSC110FSCX

Specialized Overview

The SCANPSC110FSCX is a hierarchical and multidrop addressable JTAG port bridge extending IEEE Std. 1149.1 test bus capabilities into multidrop environments. It supports up to three local scan rings accessible individually or combined serially, with addressing via six slot inputs enabling up to 59 unique addresses plus broadcast and multicast groups. The device features a 32-bit TCK counter for built-in self-test operations and a 16-bit LFSR signature compactor. It operates on a 5.0V ±10% power supply within a 28-lead SOIC package.

Specialized Feature Summary

• Supports true IEEE 1149.1 hierarchical and multidrop addressable capability with up to 59 unique addresses
• Provides three configurable local scan ports that can be bypassed, selected individually, or grouped serially
• Includes a 32-bit TCK counter for simultaneous built-in self-test operations across different scan chains
• Integrates a 16-bit Linear Feedback Shift Register (LFSR) signature compactor for test data analysis

Specialized Applications

• Hierarchical boundary-scan tree assembly for complex system testing
• Backplane and inter-board testing with localized module isolation
• Multidrop JTAG network partitioning for improved test throughput

Specialized Procurement Notes

Verify the ordering code suffix 'X' indicates tape and reel packaging when sourcing this component. Confirm the base part number matches the specific datasheet revision to ensure compatibility with existing test infrastructure. Check pinout alignment for the 28-lead SOIC package during integration planning.

Specialized Selection Notes

Select this component when a design requires extending IEEE 1149.1 standards to multidrop configurations without sacrificing test access to individual modules. Consider the six-slot input addressing scheme for systems needing distinct board identification. Evaluate the need for local scan port parking features to manage concurrent test operations effectively.

Specialized Part Context

Manufactured by Fairchild Semiconductor Corporation, now part of onsemi, this device was originally documented in March 1993 and revised in August 2000. It serves as a specialized bridge for system-level testing, allowing testers to isolate specific boards while maintaining access to remaining modules in a multidrop environment.

Specialized Replacement Considerations

No public confirmed substitute part numbers are available in the provided documentation. Verify functional equivalence regarding Level 1 and Level 2 protocol support if considering alternative hierarchical JTAG bridges.

Specialized FAQ

How does the SCANPSC110F handle bus contention in broadcast mode?

In Broadcast mode, the TDOB buffer is always 3-stated to prevent bus contention between scan-path output drivers on different boards.

What is the function of the OE input?

The OE input is an active LOW signal that 3-states all three local scan ports, allowing an alternate resource to take control of one or more local scan chains.

How many unique addresses can be assigned using the slot inputs?

The six slot inputs support up to 59 unique addresses, in addition to one Broadcast Address and four Multi-cast Group Addresses.