SCANSTA101SM

Specialized Overview

The SCANSTA101SM is a specialized interface integrated circuit manufactured by Texas Instruments, designed for low-voltage IEEE 1149.1 system test access. It supports Boundary Scan protocols to facilitate testing and debugging of electronic assemblies. The component operates within a temperature range of -40°C to +85°C and utilizes an nFBGA-49 package suitable for surface mount technology (SMD/SMT). It is classified under Interface ICs and belongs to the SCANSTA101 series.

Specialized Feature Summary

• Supports IEEE 1149.1 standard for system-level testing
• Enables Boundary Scan protocol implementation
• Designed for low-voltage applications

Specialized Applications

• System test access in electronic assemblies
• Boundary Scan testing infrastructure
• Debugging and verification of digital circuits

Specialized Procurement Notes

Verify the specific suffix requirements for the part number, as variations such as NOPB may indicate packaging or compliance differences. Confirm the manufacturer source directly from official documentation rather than distributor listings. Ensure the ordering quantity aligns with factory packaging specifications, typically provided in reels. Cross-reference the datasheet for any updates on lead times or production status before finalizing procurement plans.

Specialized Selection Notes

Select this component when IEEE 1149.1 compliance is required for system-level testing. Ensure the design accommodates the nFBGA-49 package dimensions and thermal characteristics. Verify that the operating voltage levels match the low-voltage specifications defined in the datasheet. Consider the industrial temperature range if the application involves harsh environmental conditions.

Specialized Part Context

This device is part of the SCANSTA101 series from Texas Instruments, focusing on specialized interface solutions. It serves as a key component in test access architectures, enabling efficient boundary scan operations. The series is tailored for modern electronic systems requiring robust testing capabilities without compromising on size or power consumption.