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The SGL60N90DG3YDTU is a trench-gate Insulated Gate Bipolar Transistor (IGBT) with an integrated fast recovery diode, manufactured by onsemi. It features a collector-emitter breakdown voltage of 900 V and a continuous collector current rating of 60 A at 25°C case temperature. The device operates within a junction temperature range of -55°C to +150°C. Key electrical parameters include a maximum saturation voltage of 2.7 V at 60 A and a total gate charge of 260 nC. The component utilizes a TO-264 package for thermal management.
Verify the specific ordering suffix against official documentation to confirm exact packaging or environmental compliance status. Confirm availability as product lifecycle status may vary. Ensure compatibility with existing thermal interface materials and mounting hardware specifications before procurement.
Evaluate thermal resistance characteristics relative to the application's heat dissipation requirements. Consider the gate charge and threshold voltage when designing the driver circuitry. Verify that the pulsed collector current capability meets the peak load demands of the intended circuit topology.
This component belongs to the SGL60 series of high-power IGBTs originally developed by Fairchild Semiconductor. The technology leverages trench gate architecture to minimize conduction losses while maintaining fast switching speeds. It serves as a critical power switching element in high-frequency induction applications.
SGL60N90DG3TU is a documented equivalent part number within the same family offering identical electrical specifications and pinout configuration.
The maximum collector-emitter saturation voltage is 2.7 V when tested at a collector current of 60 A and a gate-emitter voltage of 15 V.
The typical reverse recovery time is 1.5 µs under test conditions of 60 A forward current and a di/dt of 20 A/µs.
The trench gate structure provides superior conduction and switching performance compared to transistors having a planar gate structure.