SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The SSD2007ASTF is a dual N-channel power MOSFET manufactured by onsemi, formerly Fairchild Semiconductor. It features an extremely low on-state resistance and improved inductive ruggedness. The device operates with a drain-to-source voltage of 50V and continuous drain current of 2.0A at 25°C ambient temperature. Key electrical parameters include a maximum gate threshold voltage of 2.0V and a total gate charge of 8.0nC. The component utilizes a rugged polysilicon gate cell structure for fast switching times and extended safe operating area capabilities.
Verify the specific ordering suffix 'STF' against official manufacturer documentation to confirm surface-mount tape-and-reel packaging details. Ensure compatibility with standard 8-SOP footprint dimensions during PCB layout. Confirm RoHS compliance status through the latest datasheet revision before final procurement decisions.
Select this component for applications requiring dual N-channel configurations in compact surface-mount designs. Evaluate thermal resistance characteristics relative to expected ambient temperatures and duty cycles. Compare gate charge specifications against drive circuit capabilities to optimize switching performance and minimize power loss.
This part belongs to the SSD2007 series of dual N-channel power MOSFETs from Fairchild Semiconductor, now part of onsemi. The series includes variants such as SSD2009 and SSD2009A, sharing similar functional architectures but differing in specific electrical ratings and package options within the same product family lineage.
Potential substitutes include SSD2009, SSD2009A, and SSD2009ATF from Fairchild/ON Semi. Cross-manufacturer alternatives like ENA2329 or NTMFD4902NF may be considered if pinout and electrical parameters align with design requirements.
The maximum continuous drain current is 2.0A at an ambient temperature of 25°C.
Yes, the modified MOSFET symbol indicates an integral reverse P-N junction rectifier (body diode) with specified forward voltage and reverse recovery time characteristics.
The typical total gate charge (Qg) is 8.0nC under test conditions of VDS=25V, VGS=10V, and ID=1.3A.