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The Microsemi Corporation 2N6788 is a radiation-hardened N-channel power MOSFET designed for high-reliability applications. It features a TO-205AF metal can package with hermetic sealing. Key electrical parameters include a drain-source voltage (Vdss) of 100V and a continuous drain current (Id) of 6A at case temperature. The maximum on-resistance (Rds(on)) is 0.3 ohms, and the device supports a maximum junction temperature of 150°C.
Verify specific ordering suffixes to confirm exact radiation tolerance levels and qualification standards such as MIL-PRF-19500. Confirm package variations like the standard TO-205AF or leadless chip carrier options. Ensure compatibility with existing board layouts due to through-hole mounting requirements. Request detailed datasheets from authorized distributors to validate current manufacturing status and availability.
Select this component when radiation hardness and hermetic sealing are mandatory for the application environment. Compare the 6A current rating and 100V breakdown against circuit load requirements. Consider the TO-205AF footprint for mechanical integration. Evaluate thermal management needs given the 800mW power dissipation limit in free air.
This part belongs to the family of high-reliability N-channel MOSFETs manufactured by Microsemi. It shares similar electrical characteristics with other devices in the series but is distinguished by its specific radiation hardening and hermetic packaging options intended for aerospace and defense sectors.
The International Rectifier IRFE120 is documented as a close replacement offering surface mount LCC-18 packaging. Verify pinout compatibility and ensure the substitute meets the required radiation hardness specifications for the target application.