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The 2N6798 is a radiation-hardened, N-channel enhancement mode silicon power MOSFET designed for high-reliability applications. It features a hermetically sealed TO-205AF metal can package with the case connected to the drain terminal. The device supports a minimum drain-source breakdown voltage of 200 V and a maximum continuous drain current of 5.5 A. Key electrical characteristics include a maximum on-resistance of 0.4 Ω and a maximum feedback capacitance of 150 pF. It operates in enhancement mode with a maximum junction temperature of 150 °C.
Verify that the specific ordering suffix matches the required qualification level, as military variants are qualified per MIL-PRF-19500/557. Confirm the presence of the radiation-hardened designation and the correct package style during procurement. Ensure the component meets the necessary environmental specifications for the intended deployment scenario.
Select this component when a ruggedized N-channel MOSFET with low on-resistance is required for space-constrained designs. The TO-205AF package provides a robust mechanical interface for high-power dissipation. Consider the built-in diode functionality if synchronous rectification or freewheeling paths are needed within the circuit topology.
This part belongs to a family of N-channel enhancement mode MOSFETs available in various voltage ratings including 100 V, 200 V, 400 V, and 500 V. The 2N6798 specifically addresses the 200 V rating category. These devices utilize advanced MOSFET technology to deliver high performance while maintaining small physical dimensions suitable for strict size constraints.
Substitutes must be verified against MIL-PRF-19500/557 qualifications. Check for identical pinout compatibility in the TO-205AF package. Ensure replacement parts maintain equivalent radiation hardness levels and thermal management capabilities.