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2PB1219AQ,135 is listed in the Single Bipolar Transistors range at ChipApex. The manufacturer field lists Nexperia USA Inc.. Its product description is TRANS PNP 50V 0.5A SOT-323. Review the specifications below when checking this part for your BOM.
The Nexperia 2PB1219AQ,135 is a PNP general-purpose bipolar junction transistor (BJT) housed in a SOT-323 surface-mount package. It supports a maximum collector current of 500 mA and features a collector-emitter voltage rating of -50 V. The device offers a transition frequency of 100 MHz and a DC current gain ranging from 85 to 170 at specific operating conditions. Designed for high reliability, it operates within an ambient temperature range of -65 °C to +150 °C.
Verify the exact ordering code matches the required binning suffix. Confirm RoHS compliance status with the supplier. Ensure the component is sourced from authorized Nexperia distribution channels to guarantee authenticity. Check the latest datasheet revision before finalizing the bill of materials.
Select this component for designs requiring a compact PNP transistor with moderate current drive capabilities. Compare the hFE binning requirements against circuit gain specifications. Evaluate thermal resistance limits under expected load conditions. Consider the SOT-323 footprint constraints during PCB layout planning.
This part belongs to the Nexperia discrete semiconductor portfolio, specifically the general-purpose transistor category. It serves as a standard replacement for legacy NXP components in industrial and consumer electronics. The product line focuses on automotive and computing markets requiring reliable switching performance.
The 2PD1820A is documented as the NPN complement. Verify pinout compatibility when substituting with other SOT-323 PNP transistors. Ensure equivalent hFE ranges and saturation voltages are met for direct replacement.
The maximum DC collector current is rated at 500 mA.
It utilizes the SOT-323 (SC-70) plastic surface-mount package.
The transition frequency is 100 MHz under standard test conditions.
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