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2SC4081U3T106Q is listed in the Single Bipolar Transistors range at ChipApex. The manufacturer field lists Rohm Semiconductor. Its product description is TRANS NPN 50V 0.15A UMT3. Review the specifications below when checking this part for your BOM.
The 2SC4081U3T106Q is an NPN silicon general-purpose small signal amplifier transistor manufactured by ROHM Semiconductor. It operates with a collector-emitter voltage of 50V and a continuous collector current of 150mA, supporting a single pulse current of 200mA. The device features a transition frequency of 180MHz and a typical output capacitance of 2.0pF. Power dissipation is rated at 200mW, with a junction temperature range up to 150°C. DC current gain (hFE) ranges from 120 to 560 depending on the rank.
Verify the exact ordering suffix against the manufacturer's official documentation to confirm packaging specifications and binning requirements. Confirm RoHS compliance status and lead times directly with authorized distributors or the manufacturer before finalizing procurement plans.
Select this component for low-voltage, low-power amplification tasks requiring high-speed performance within a compact surface-mount footprint. Ensure the required hFE rank aligns with circuit design constraints and verify thermal management capabilities for the intended operating environment.
This part belongs to the 2SC4081 series of general-purpose small signal transistors. It shares electrical characteristics with related models such as the 2SC4081UB and 2SC4081, differing primarily in package type and manufacturing revisions. The U3 designation indicates the SOT-323 package configuration.
Direct substitutes include the 2SC4081UBTLR and similar variants within the same family. Verify pinout compatibility and electrical parameter overlaps before implementation.
The maximum collector-base voltage (VCBO) is rated at 60V.
No, the datasheet explicitly states that this product is not recommended for use in automotive equipment.
The typical output capacitance (Cob) is 2.0pF under specified test conditions.
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