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2STR1160 is listed in the Single Bipolar Transistors range at ChipApex. The manufacturer field lists STMicroelectronics. Its product description is TRANS NPN 60V 1A SOT-23-3. Review the specifications below when checking this part for your BOM.
The STMicroelectronics 2STR1160 is a low voltage fast-switching NPN power transistor manufactured using PB-HCD technology. It features a collector-emitter saturation voltage of 130 mV to 430 mV and a DC current gain ranging from 30 to 560. The device supports a maximum collector current of 1 A with a peak current of 2 A, operating within a collector-emitter voltage range up to 60 V. It utilizes an SOT-23 package for surface mounting.
Verify the specific revision level against the latest official datasheet before finalizing designs. Confirm that the SOT-23 tape and reel packing matches production requirements. Ensure thermal management aligns with the specified junction-to-ambient resistance values under actual PCB layout conditions.
Select this component when low saturation voltage and high current gain are critical for efficiency in low-voltage applications. Consider the complementary PNP 2STR2160 if push-pull configurations are required. Evaluate the SOT-23 package constraints regarding thermal dissipation and physical space limitations in the target circuit design.
This NPN power transistor belongs to STMicroelectronics' low voltage discrete semiconductor portfolio. It is designed for general-purpose switching and amplification tasks where compact size and high performance are necessary. The device complements other bipolar transistors in the series for balanced circuit implementations.
The complementary PNP transistor is the 2STR2160. Verify pinout compatibility and electrical characteristics against alternative suppliers' equivalents before substitution.
The device is manufactured using new PB-HCD (Power Bipolar High Current Density) technology.
The maximum collector-emitter breakdown voltage (V(BR)CEO) is 60 V.
The typical turn-on time (ton) is 220 ns under specified test conditions.
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