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AON6532 is listed in the Single FETs, MOSFETs range at ChipApex. The manufacturer field lists Alpha & Omega Semiconductor Inc.. Its product description is MOSFET N CH 30V 27A 8DFN. Review the specifications below when checking this part for your BOM.
The AON6532 is a 30V N-Channel AlphaMOS power MOSFET in a DFN5X6 package. It features a maximum drain current of 68A at VGS=10V and an on-resistance below 5.0mΩ at VGS=10V, or below 9.0mΩ at VGS=4.5V. The device has a gate-source voltage rating of ±20V and operates within a junction temperature range of -55°C to 150°C. Thermal resistance from junction-to-case is 3.5°C/W, while junction-to-ambient is 55°C/W. It includes 100% UIS and Rg testing.
Verify the specific ordering suffix against the manufacturer's official documentation to confirm exact packaging and tape-and-reel specifications. Confirm compliance status directly via the datasheet or component declaration documents provided by Alpha & Omega Semiconductor before finalizing procurement plans.
Select this component for applications requiring low conduction losses at standard logic-level gate voltages. Ensure the thermal design accommodates the specified junction-to-ambient resistance values. Verify that the required continuous and pulsed drain currents remain within the absolute maximum ratings defined in the electrical characteristics table.
This part belongs to the AlphaMOS product line from Alpha & Omega Semiconductor, focusing on advanced trench power MOSFETs. The DFN5X6 package provides a compact footprint optimized for surface-mount assembly. The device is designed primarily for consumer market applications as stated in the general description.
Consult official cross-reference lists from Alpha & Omega Semiconductor for verified substitutes. Do not assume functional equivalence based solely on matching voltage and current ratings without verifying pinout and thermal parameters.
The maximum gate-source voltage is rated at ±20V.
Yes, the datasheet confirms that the AON6532 undergoes 100% Unclamped Inductive Switching (UIS) testing.
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