SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The Nexperia BUK9K12-80L is a dual N-channel logic level MOSFET housed in an LFPAK56D (SOT1205) package. It utilizes Trench12 technology and meets AEC-Q101 standards for automotive use. Key electrical parameters include a drain-source voltage of 80 V, continuous drain current of 51 A at 25 °C mounting base temperature, and total power dissipation of 68 W. The typical on-state resistance is 8.8 mΩ at VGS = 10 V and ID = 15 A. Gate charge is typically 22 nC at VGS = 5 V.
Verify the specific ordering suffix against the manufacturer's official documentation to confirm availability and exact specifications. Confirm that the component matches the required AEC-Q101 qualification status for your target application environment. Ensure compatibility with the LFPAK56D (SOT1205) surface mount package dimensions during PCB layout design.
Select this component when space constraints require a dual MOSFET solution within a standard Dual Power-SO8 footprint. The low on-state resistance supports high-current applications up to 51 A. Consider the thermal resistance characteristics and the requirement for side-wettable flanks if automated optical inspection is part of the manufacturing process.
This device belongs to Nexperia's BUK9K series of logic level MOSFETs. It employs Trench12 technology to achieve low on-resistance and fast switching speeds. The product is specifically engineered for automotive environments, offering ruggedness through repetitive avalanche rating capabilities and high-temperature stability.
BUK9K12-80EX
The maximum non-repetitive drain-source avalanche energy is 88.9 mJ under conditions of ID = 27.6 A, Vsup ≤ 80 V, RGS = 50 Ω, VGS = 5 V, and initial junction temperature of 25 °C.
The gate-source threshold voltage decreases as the junction temperature increases. At 25 °C, it ranges from 1.4 V to 2.05 V, while at 175 °C, the minimum value drops to 0.5 V.
Pin 1 is Source 1, Pin 2 is Gate 1, Pin 3 is Source 2, Pin 4 is Gate 2, Pins 5 and 6 are Drain 2, and Pins 7 and 8 are Drain 1.