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The CP206-2N4856-CT is a silicon N-channel JFET bare die designed for analog switching and chopper applications. It features a 21 x 18 mils die size with an 8.0 mils thickness. The device supports a drain-source voltage of 40 V and operates within a junction temperature range of -65 to +175 °C. Electrical characteristics include a maximum gate leakage current of 0.25 nA at 20 V, an on-state resistance of 25 Ω, and input capacitance of 18 pF. The part is supplied in singulated waffle pack trays.
This component is classified as End of Life due to the discontinuation of the CP206 wafer process. Last purchase orders must be placed within six months of the notification date, with final shipments occurring twelve months after notice. Availability is limited to existing inventory; no new production runs are scheduled. Buyers should verify stock status directly with Central Semiconductor representatives before committing to orders.
Engineers requiring this specific electrical profile should consider the CP216-2N4856-CT as the designated replacement from the updated wafer process. Verify that mechanical dimensions and pad configurations remain compatible with existing board layouts. Consult application engineering for SPICE models or custom screening requirements if transitioning from the legacy CP206 process.
Central Semiconductor manufactures this device as a bare die rather than a packaged transistor. The product line utilizes a specific wafer process that has been retired in favor of newer manufacturing technologies. This transition affects supply continuity and necessitates careful planning for long-term production cycles involving analog front-end designs.
The official replacement is the CP216-2N4856-CT, utilizing the updated CP216 wafer process. Ensure mechanical compatibility regarding die size and pad placement when migrating to the successor part number.
The maximum operating and storage junction temperature is +175 °C.
The device is supplied as a bare die in a singulated waffle pack tray (CT option).
The typical turn-off time (toff) is 25 ns under standard test conditions.