SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
FCAB21520L1 is listed in the FET, MOSFET Arrays range at ChipApex. The manufacturer field lists Panasonic Electronic Components. Its product description is MOSFET 2N-CH 10SMD. Review the specifications below when checking this part for your BOM.
The FCAB21520L1 is a dual N-channel MOSFET in a CSP-4 package, designed for lithium-ion secondary battery protection circuits. It features a source-source breakdown voltage of 12 V and a continuous source current of 35 A on ceramic substrates. The typical source-source on-state resistance is 1.6 mΩ at VGS = 3.8 V. Total power dissipation reaches 0.54 W on FR4 boards and 3.8 W on ceramic substrates. Operating junction temperature extends to +150 °C with a storage range of -55 °C to +150 °C.
Verify the specific datasheet revision against Panasonic's official documentation before finalizing designs. Confirm that the CSP-4 package dimensions align with the provided land pattern reference. Ensure compliance with JEITA standards and RoHS directives as specified in the product standards section.
Select this component when low on-resistance is critical for minimizing power loss in battery management systems. Evaluate thermal requirements carefully; use ceramic substrates to maximize power dissipation capabilities. Verify gate drive voltages match the threshold characteristics for optimal switching performance.
This device belongs to the FCAB series of dual MOSFETs manufactured by Panasonic Industrial Devices. It utilizes a Chip Size Package (CSP) to provide a compact footprint suitable for space-constrained portable electronics and battery packs requiring efficient power switching.
No public confirmed substitute part numbers are available in the provided documentation.
The maximum continuous source current is 35 A when mounted on a ceramic substrate.
Thermal resistance varies significantly based on the mounting surface; it is 160 °C/W on FR4 boards and 232 °C/W on ceramic substrates.
The total gate charge (Qg) is typically 6.8 nC under standard test conditions.
Explore related parts through FETs, MOSFETs, Transistors, Discrete Semiconductor Products, all product categories.