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The GH50H65DRB2-7AG is an automotive-grade trench gate field-stop IGBT featuring a co-packed freewheeling diode, housed in an H²PAK-7 package. It belongs to the high-speed HB2 series with a collector-emitter voltage of 650 V and continuous collector current of 108 A at 25 °C case temperature. The device exhibits a typical saturation voltage of 1.6 V at 50 A and operates up to a maximum junction temperature of 175 °C. Thermal resistance from junction to case is 0.39 °C/W for the IGBT and 0.75 °C/W for the diode. Total gate charge is typically 152 nC at 520 V and 50 A.
Verify component authenticity by cross-referencing the marking code G50H65RB2A against official STMicroelectronics documentation. Confirm the package type is H²PAK-7 and that the part is supplied in tape and reel packaging. Ensure the specific revision DS14757 Rev 3 is referenced during procurement to align with the latest electrical characteristics and thermal data provided in the datasheet.
Select this component for applications requiring high-speed switching and robust thermal performance in automotive environments. The positive temperature coefficient of VCE(sat) facilitates safe parallel operation without active current balancing. Consider the 175 °C maximum junction temperature rating when designing thermal management solutions for high-power density systems such as on-board chargers.
This IGBT is part of the HB2 series, representing an evolution of the trench gate field-stop structure. The series is optimized for conduction losses at low currents and reduced switching energy compared to previous generations. The integration of a high-ruggedness rectifier diode in the same package simplifies circuit design for hard-switching applications.
No public confirmed substitute part numbers are available in the source material.
The maximum operating junction temperature is 175 °C.
It features a positive VCE(sat) temperature coefficient, which helps ensure stable current sharing during parallel operation.
The extra driving Kelvin pin provides a separate path for gate drive signals, improving switching performance by minimizing noise coupling from the power loop.