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GT090N06D52 is listed in the FET, MOSFET Arrays range at ChipApex. The manufacturer field lists Goford Semiconductor. Its product description is MOSFET 2N-CH 60V 40A 8DFN. Review the specifications below when checking this part for your BOM.
The GT090N06D52 is a dual N-channel enhancement mode power MOSFET manufactured by Goford Semiconductor. It utilizes advanced trench technology to achieve low on-resistance and gate charge. The device features a 60V drain-source voltage rating and supports a continuous drain current of 40A at 25°C case temperature. Key electrical parameters include an on-resistance of less than 14mΩ at VGS=10V and 18mΩ at VGS=4.5V. Total gate charge is typically 22nC. The component is housed in a DFN5X6 package with a junction-to-case thermal resistance of 2°C/W.
Verify the specific datasheet revision (A1348.06-V1.3) matches your design requirements. Confirm that the DFN5X6-8L package dimensions align with your PCB footprint. Ensure thermal management strategies account for the specified junction-to-case resistance during operation.
Select this component for applications requiring a dual N-channel configuration with low conduction losses. The 60V rating suits medium-voltage DC-DC conversion tasks. Verify that the gate drive voltage meets the threshold requirements for optimal RDS(ON) performance, particularly if operating below 10V.
This part belongs to the Goford Semiconductor power MOSFET lineup designed for general-purpose switching applications. The dual configuration allows for compact designs in half-bridge or synchronous rectifier topologies. The DFN5X6 package offers a small footprint suitable for space-constrained electronics.
Public confirmed substitute part numbers are not available in the provided documentation. Consult manufacturer cross-reference lists for verified alternatives.
The maximum pulsed drain current (IDM) is 160A, limited by the maximum junction temperature.
Yes, the GT090N06D52 is 100% avalanche tested, with a single pulse avalanche energy rating of 56mJ under specified conditions.
The typical reverse recovery time (Trr) is 19ns when tested at IF=14A, VGS=0V, and di/dt=500A/us.
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