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HUFA76413DK8T is listed in the FET, MOSFET Arrays range at ChipApex. The manufacturer field lists onsemi. Its product description is MOSFET 2N-CH 60V 5.1A 8SOIC. Review the specifications below when checking this part for your BOM.
The HUFA76413DK8T is a dual N-Channel Logic Level UltraFET power MOSFET manufactured using an advanced silicon process. It features a SO-8 surface-mount package with two independent channels. The device supports a drain-source voltage of 60V and continuous drain currents up to 5.1A at VGS=10V or 4.8A at VGS=5V. On-resistance is specified at 49mΩ (VGS=10V) and 56mΩ (VGS=5V). It operates within a temperature range of -55°C to +150°C, dissipates 2.5W of power, and includes unclamped inductive switching capability.
Verify component authenticity by checking manufacturer markings against official datasheet specifications. Confirm package type and pinout alignment before integration. Review thermal resistance data relative to specific PCB copper pad areas to ensure junction temperatures remain within safe operating limits during operation.
Evaluate thermal requirements based on the specific mounting pad area and board layer configuration. Select appropriate gate resistors to manage switching speeds and minimize electromagnetic interference. Ensure the application voltage and current levels do not exceed the maximum ratings defined in the electrical characteristics table.
This component belongs to the UltraFET family of power MOSFETs designed for high efficiency and low conduction losses. It utilizes Fairchild Semiconductor's proprietary process technology to optimize performance per silicon area. The part is intended for general-purpose switching applications requiring reliable operation in automotive and industrial environments.
HUFA76413DK8
The device can withstand a single pulse avalanche energy of 260 mJ when starting at a junction temperature of 25°C.
The typical on-resistance is 41mΩ at VGS=10V and increases to 48mΩ at VGS=5V under standard test conditions.
The reverse recovery time is typically 43 ns when tested with a source-drain current of 4.8A and a rate of change of current of 100A/µs.
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