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ZXT13N50DE6TA is listed in the Single Bipolar Transistors range at ChipApex. The manufacturer field lists Diodes Incorporated. Its product description is TRANS NPN 50V 4A SOT-26. Review the specifications below when checking this part for your BOM.
The ZXT13N50DE6TA is a single NPN silicon switching transistor manufactured by Diodes Incorporated. It operates with a collector-emitter voltage of 50V and supports a continuous collector current of 4A, with a peak pulse current capability of 10A. The device features a low saturation voltage of 100mV maximum at 1A and an equivalent on-resistance of 36mΩ. Packaged in a SOT-26 (SuperSOT) surface-mount case, it offers a power dissipation rating of 1.1W and operates within a temperature range of -55°C to +150°C.
Verify the specific ordering suffix against official documentation to confirm packaging quantity and compliance status. The standard tape and reel configuration contains 3,000 units per 7-inch reel. Confirm that the selected variant meets the required automotive or industrial qualification standards before finalizing procurement specifications.
Select this component when a single NPN switch requires high current handling up to 4A with minimal voltage drop. The SOT-26 package provides a compact footprint suitable for dense PCB layouts. Ensure the application accounts for the thermal resistance characteristics and derating requirements specified in the datasheet to maintain safe operating temperatures.
This part belongs to the ZXT13N series of low saturation switching transistors from Diodes Incorporated. These devices are designed to replace traditional bipolar transistors in applications demanding lower heat generation and higher efficiency. The product line includes various voltage ratings and configurations tailored for modern power management circuits.
ZXT13N50DE6QTA
The maximum collector-emitter breakdown voltage (BVCEO) is 50V.
Yes, the ZXT13N50DE6TA is qualified to AEC-Q101 standards for high reliability.
The typical turn-off time (toff) is 830ns under standard test conditions.
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