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The CG2H80045D is a gallium nitride (GaN) High Electron Mobility Transistor (HEMT) die designed for high-power RF applications. It operates at frequencies up to 8.0 GHz with a typical saturated output power of 45 W and drain efficiency of 65% at 28 V bias. The device features a breakdown voltage of 120 V, a gate threshold voltage ranging from -3.8 V to -2.3 V, and a maximum continuous drain current of 4.5 A. Thermal resistance from junction to case is specified at 2.1 °C/W for the bare die configuration.
Verify the specific part number against the official MACOM datasheet to ensure correct revision status. Confirm that the procurement includes the required Gel-Pak packaging for bare die handling. Ensure all technical specifications align with the intended system requirements before finalizing orders.
Select this component for designs requiring high power density and wide bandwidth in the S-band or C-band ranges. Evaluate thermal management strategies carefully due to the high power dissipation capabilities. Verify compatibility with large signal models available for ADS and MWO during the design phase.
This component belongs to MACOM's portfolio of GaN on Silicon Carbide (GaN-on-SiC) transistors. These devices leverage the superior properties of GaN, including higher breakdown voltage and thermal conductivity compared to silicon or gallium arsenide alternatives. The product line targets high-efficiency RF power amplification.
No official substitute part numbers are documented in the provided datasheet. Engineers should evaluate cross-compatibility based on electrical parameters such as breakdown voltage, gain, and package dimensions when considering alternative sources.
The typical small signal gain is 15 dB at 4 GHz.
Bare dies are shipped in Gel-Pak containers with a non-adhesive tacky membrane to immobilize the die during shipment.
The recommended solder is AuSn (80/20) solder using eutectic die attach procedures.