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The CG2H80120D is a gallium nitride (GaN) high electron mobility transistor (HEMT) die designed for operation up to 8.0 GHz. It delivers a typical saturated output power of 120 W at 28 V drain bias. The device provides 15 dB small signal gain at 4 GHz and 12 dB at 8 GHz, with a drain efficiency of 65%. Key electrical parameters include a drain-source breakdown voltage of 84 V, a maximum forward gate current of 30 mA, and an operating junction temperature rating of 225 °C.
Verify the specific ordering suffix against the manufacturer's official documentation before purchase. Confirm that the received component matches the bare die specification rather than a packaged variant. Ensure handling procedures account for the Gel-Pak shipping container and electrostatic discharge sensitivity inherent to this semiconductor type.
Select this component when designing circuits requiring high power output and wide bandwidth in the microwave spectrum. Evaluate thermal management requirements carefully due to the high power dissipation and elevated junction temperature capabilities. Verify compatibility with recommended eutectic die attach materials and gold wire bonding methods for optimal performance.
This part belongs to MACOM's portfolio of GaN on SiC transistors engineered for superior breakdown voltage and thermal conductivity compared to silicon or gallium arsenide alternatives. It is intended for demanding RF applications where high power density and efficiency are critical design constraints.
No official substitute part numbers are documented in the provided datasheet. When evaluating alternative components, verify matching RF characteristics, power ratings, and physical dimensions to ensure mechanical and electrical compatibility within the existing circuit design.
The recommended solder is AuSn (80/20) solder using a eutectic die attach procedure.
Use the die label marked with XX-YY coordinates to determine the correct orientation.
Yes, large signal models are available for ADS and MWO software platforms.