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The CGHV1J025D is a high-voltage GaN HEMT die on a silicon carbide substrate, utilizing a 0.25μm gate length process. It operates from 10 GHz to 18 GHz at 40 V with a breakdown voltage of 100 V. Key electrical characteristics include a typical small signal gain of 17 dB and a power-added efficiency (PAE) of 60% at 10 GHz. The device delivers a typical saturated output power (PSAT) of 25 W. Absolute maximum ratings specify a drain-source voltage of 120 VDC and an operating junction temperature up to 225°C.
Verify the specific revision level against the manufacturer's latest documentation before finalizing designs. Confirm that the bare die packaging in Gel-Pak containers meets your handling requirements. Ensure compatibility with recommended AuSn soldering processes and vacuum collet pick-up methods during assembly. Validate thermal resistance parameters relative to your specific carrier mounting conditions.
Select this component for designs requiring high power density and efficiency in the Ku-band spectrum. The bare die format necessitates custom RF layout and wire bonding integration. Evaluate the 120 V absolute maximum rating against system transient voltages. Consider the 3.91 °C/W thermal resistance when designing the heat dissipation path for the silicon carbide substrate.
This part belongs to MACOM's CGHV series of high-voltage GaN HEMTs. It utilizes a 0.25μm gate length fabrication process on a silicon carbide substrate. The product line targets broadband amplifier applications requiring high power output and efficiency in microwave frequency ranges.
Public confirmed substitute part numbers are not available in the provided datasheet or verified local source material.