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The CP398X-CTLDM303N is an N-channel enhancement-mode silicon MOSFET die designed for high-speed pulsed amplifier and driver applications. It features a drain-source voltage of 30 V, gate-source voltage of 12 V, continuous drain current of 3.6 A, and maximum pulsed drain current of 14.4 A. The junction temperature range is -55 to +150 °C. Electrical characteristics include a typical on-resistance of 0.04 Ω at VGS=4.5V and 0.078 Ω at VGS=2.5V. Total gate charge is 13 nC, with turn-on time of 15 ns and turn-off time of 29 ns under specified test conditions.
Verify the specific suffix required for your packaging needs. Options include unsawn wafers (WN), sawn wafers on plastic rings (WR), singulated die in trays (CT), or visually inspected singulated die (CM). Contact Central Semiconductor sales representatives directly for special orders such as sawn wafers on metal frames or custom plating requirements like Tin/Lead or PbFree finishes.
Select this component when designing circuits requiring fast switching speeds and robust pulsed current handling capabilities. Ensure the application operates within the specified 30 V drain-source and 12 V gate-source limits. Consider the thermal management requirements given the wide operating junction temperature range up to +150 °C. Verify that the drive circuitry can supply the necessary gate charge efficiently to maintain the low turn-on and turn-off times.
This part is a bare die semiconductor device manufactured by Central Semiconductor Corp. Unlike packaged transistors, it requires integration into custom substrates or hybrid circuits. The die dimensions are 37.8 x 26 mils with a thickness of 5.5 mils. It utilizes aluminum top-side metalization and a titanium/nickel/silver back-side metalization scheme for thermal and electrical connectivity.
No public confirmed substitute part numbers are available in the provided documentation.