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The FBG10N05AC is a radiation-hardened enhancement-mode Gallium Nitride (GaN) Field-Effect Transistor manufactured by EPC Space, LLC. It features an N-channel configuration with a drain-to-source voltage rating of 100 V and a continuous current capacity of 5 A at case temperature. The device exhibits a typical on-resistance of 58 mΩ. It is housed in a surface-mount FSMD-A package, designed for high-reliability applications requiring resistance to ionizing radiation.
Verify the specific screening level and quality documentation required for your mission profile before procurement. Confirm that the FSMD-A package variant matches your PCB footprint requirements. Ensure compatibility with radiation tolerance specifications defined by your system architecture. Request official datasheets and test reports from authorized distributors to validate component authenticity and performance history.
Select this component when radiation hardness is mandatory for the operating environment. Consider the 100 V voltage rating and 5 A current limit against load requirements. Evaluate the thermal performance of the FSMD-A package within the system's cooling constraints. Compare total cost of ownership including qualification efforts against standard commercial alternatives.
EPC Space specializes in radiation-hardened GaN-on-silicon transistors for satellites and high-reliability power systems. The FBG10N05AC belongs to their portfolio of enhanced-reliability discrete devices engineered for harsh environments where traditional silicon components may fail due to radiation effects.
No public confirmed substitute part numbers are available.