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The NE85619-T1 is an NPN epitaxial silicon high-frequency transistor manufactured by CEL. It features a gain bandwidth product of 7 GHz and a noise figure of 1.4 dB at 1 GHz. The device supports a maximum collector current of 100 mA with a forward current gain ranging from 50 to 300. Electrical characteristics are specified at VCE = 10 V and IC = 20 mA for fT, while noise parameters are measured at VCE = 10 V and IC = 7 mA. The component utilizes titanium/platinum/gold metallization and direct nitride passivated base surface processing for reliability.
Verify the specific suffix T1 against official documentation to confirm tape and reel packaging specifications. Confirm that the NE85619 variant meets current design requirements as other series numbers may be restricted for new designs. Cross-reference manufacturer datasheets for exact mechanical dimensions and handling instructions.
Select this component when low noise figures and high gain are required in compact form factors. Evaluate thermal resistance and power dissipation limits relative to the target ambient temperature. Ensure biasing conditions align with the specified VCE and IC ranges to maintain optimal noise and gain performance.
This part belongs to the NEC/CEL NE856 series of NPN silicon transistors designed for high-frequency applications. The series offers various package options including chip, Micro-x, and plastic styles. The NE85619 specifically utilizes a SOT-343 style outline, providing a balance between performance and size for consumer and industrial electronics.
Consult official documentation for authorized substitutes within the NE856 series. Verify pinout compatibility and electrical parameter overlaps before implementation.