FMWAN075-15ELSF

Antennas RF Overview

The FMWAN075-15ELSF is a standard gain horn antenna manufactured by Fairview Microwave. It operates within the WR-75 waveguide frequency range, covering 40 GHz to 60 GHz. The component features an end-launch SMA female connector for signal interfacing. It provides a nominal gain of 15 dBi and utilizes a 31-degree 3dB beamwidth. The unit is constructed with gold-plated brass elements and includes a waveguide mount interface.

Antennas RF Feature Summary

• Standard gain horn design optimized for high-frequency waveguide applications
• End-launch SMA female connector facilitates direct cable integration
• Gold-plated brass construction ensures durability and signal integrity

Antennas RF Applications

• Microwave measurement systems requiring precise gain references
• Antenna pattern testing and characterization setups
• Radio frequency calibration equipment

Antennas RF Procurement Notes

Verify the specific datasheet version provided by Fairview Microwave or authorized distributors before procurement. Confirm that the SMA female connector orientation matches your test setup requirements. Ensure compatibility with WR-75 waveguide standards in your application environment. Check for any recent manufacturing updates that may affect physical dimensions or surface finish specifications.

Antennas RF Selection Notes

Select this model when a fixed 15 dBi gain reference is required for the WR-75 band. Consider the end-launch SMA interface for convenient coaxial connections. Evaluate the 31-degree beamwidth against your spatial coverage needs. Compare physical mounting constraints with existing waveguide infrastructure to ensure mechanical fit.

Antennas RF Part Context

This component belongs to Fairview Microwave's comprehensive selection of waveguide antennas. It serves as a precision passive device for microwave engineering tasks. The product line emphasizes reliable performance in high-frequency environments. It complements other RF components used in laboratory and industrial measurement scenarios.