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SN74ABTH18646APM is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN-TEST-DEV/TXRX 64-LQFP. Review the specifications below when checking this part for your BOM.
The SN74ABTH18646APM is a scan test device featuring an 18-bit bus transceiver and registers, part of the Texas Instruments SCOPE family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). The device operates within a temperature range of -40°C to +85°C and utilizes a 64-pin LQFP package.
Verify that the specific ordering suffix 'PM' corresponds to the 64-pin Plastic Thin Quad Flat package with 0.5-mm center-to-center spacings as documented in the datasheet. Confirm that the component meets the specified commercial operating temperature range of -40°C to +85°C for your application requirements.
Select this component when designing systems requiring integrated boundary-scan capabilities alongside high-speed data transfer. It is suitable for applications needing multiplexed transmission of both real-time and stored data. Ensure the design accommodates the 4-wire TAP interface signals including TDI, TDO, TMS, and TCK for proper test access.
This device belongs to the Texas Instruments SCOPE family of testability products and the Widebus family. It is designed using state-of-the-art EPIC-IIB BiCMOS technology. The SN74ABTH18646A variant is characterized for commercial temperature ranges, distinct from the military-grade SN54 counterpart.
SN74ABTH182646APM
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