Specialty Logic SN74ABTH18646APM product image

SN74ABTH18646APM

$12.89
  • Description:IC SCAN-TEST-DEV/TXRX 64-LQFP
  • Series:74ABTH
  • Mfr:Texas Instruments
  • Package:Bulk,Tray

SKU:533dd1b32027 Category: Brand:

  
  • Quantity
    • -
    • +
  •    
ChipApex WhatsApp

Consult the customer manager about the wholesale price.

consultation hotline:86-132-6715-2157

email:[email protected]
Contact the product manager for consultation. One-stop consultation is available.


Do you want a lower wholesale price? Please send us your inquiry and we will reply immediately.

Submitting!
Submission successful!
Submission failed!
Email error!
Phone number error!

SN74ABTH18646APM is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN-TEST-DEV/TXRX 64-LQFP. Review the specifications below when checking this part for your BOM.

Specialty Logic specifications for SN74ABTH18646APM

  • Description:IC SCAN-TEST-DEV/TXRX 64-LQFP
  • Series:74ABTH
  • Mfr:Texas Instruments
  • Package:Bulk,Tray
  • Logic Type:Scan Test Device With Transceivers And Registers
  • Supply Voltage:4.5V ~ 5.5V
  • Number of Bits:18
  • Operating Temperature:-40°C ~ 85°C
  • Mounting Type:Surface Mount
  • Package / Case:64-LQFP
  • Supplier Device Package:64-LQFP (10x10)
  • Grade:-
  • Qualification:-

Specialty Logic datasheet and documents for SN74ABTH18646APM

SN74ABTH18646APM

Specialty Logic Overview

The SN74ABTH18646APM is a scan test device featuring an 18-bit bus transceiver and registers, part of the Texas Instruments SCOPE family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). The device operates within a temperature range of -40°C to +85°C and utilizes a 64-pin LQFP package.

Specialty Logic Feature Summary

  • Supports IEEE Standard 1149.1-1990 boundary-scan testing for complex circuit-board assemblies
  • Enables multiplexed transmission of stored and real-time data through D-type flip-flops
  • Includes active bus-hold circuitry on data inputs to eliminate external pullup resistors
  • Provides one boundary-scan cell per I/O pin to improve scan efficiency

Specialty Logic Applications

  • Boundary-scan testing of complex circuit-board assemblies
  • Self-test operations on boundary-test cells
  • Parallel-signature analysis at inputs
  • Pseudo-random pattern generation from outputs

Specialty Logic Procurement Notes

Verify that the specific ordering suffix 'PM' corresponds to the 64-pin Plastic Thin Quad Flat package with 0.5-mm center-to-center spacings as documented in the datasheet. Confirm that the component meets the specified commercial operating temperature range of -40°C to +85°C for your application requirements.

Specialty Logic Selection Notes

Select this component when designing systems requiring integrated boundary-scan capabilities alongside high-speed data transfer. It is suitable for applications needing multiplexed transmission of both real-time and stored data. Ensure the design accommodates the 4-wire TAP interface signals including TDI, TDO, TMS, and TCK for proper test access.

Specialty Logic Part Context

This device belongs to the Texas Instruments SCOPE family of testability products and the Widebus family. It is designed using state-of-the-art EPIC-IIB BiCMOS technology. The SN74ABTH18646A variant is characterized for commercial temperature ranges, distinct from the military-grade SN54 counterpart.

Specialty Logic Replacement Considerations

SN74ABTH182646APM

SN74ABTH18646APMSN74ABTH18646APM
$12.89
Buy Now

Recent News