SN74F112DR

Flip Flops Overview

The SN74F112DR is a dual negative-edge-triggered J-K flip-flop manufactured by Texas Instruments. It integrates two independent flip-flops within a single 16-pin SOIC package. Each element features active-low clear (CLR) and preset (PRE) inputs, allowing for immediate state initialization. The device operates with standard TTL-compatible logic levels and is designed for high-speed digital applications requiring reliable data storage and transfer capabilities.

Flip Flops Feature Summary

• Dual independent J-K flip-flop configuration
• Negative-edge clock triggering mechanism
• Active-low asynchronous clear and preset controls

Flip Flops Applications

• Digital data storage circuits
• Shift register implementations
• Frequency division networks

Flip Flops Procurement Notes

Verify the specific ordering suffix 'DR' corresponds to the tape-and-reel packaging format required for automated assembly processes. Confirm that the active-low input polarity matches the system design requirements before finalizing procurement orders to ensure functional compatibility.

Flip Flops Selection Notes

Select this component when a compact solution for dual J-K functionality is required in surface-mount designs. Ensure the operating temperature range of 0°C to 70°C aligns with the environmental conditions of the target application. Validate that the 16-SOIC footprint fits the available PCB real estate constraints.

Flip Flops Part Context

This part belongs to the Texas Instruments SN74F series, known for high-speed CMOS technology. It serves as a fundamental building block for sequential logic systems. The DR suffix indicates a reel-packaged variant suitable for high-volume manufacturing environments compared to tube-packaged alternatives.

Flip Flops Replacement Considerations

Public confirmed substitute part numbers are not provided in the source documentation. Verify pinout and electrical specifications against potential cross-reference components from other manufacturers to ensure direct replacement viability without circuit modification.