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SN74LVTH18504APM is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN-TEST-DEV/XCVR 64-LQFP. Review the specifications below when checking this part for your BOM.
The SN74LVTH18504APM is a 3.3V ABT scan test device manufactured by Texas Instruments, featuring a 20-bit universal bus transceiver. It operates within a supply voltage range of 2.7V to 3.6V and supports an operating temperature range of -40°C to +85°C. The component is housed in a 64-pin LQFP (PM) package.
Verify the complete part number including the 'APM' suffix to ensure the correct LQFP-64 package and industrial temperature grade are obtained. Confirm that the specific revision matches the required design specifications. Cross-reference with official Texas Instruments documentation to validate pinout compatibility and electrical characteristics before finalizing procurement orders.
Select this component when a high-density 20-bit bidirectional interface is required within a single package. It is suitable for designs needing integrated scan test capabilities to simplify manufacturing testing processes. Ensure the system power supply remains within the 2.7V to 3.6V range and that the operating environment falls within the specified -40°C to +85°C limits for reliable performance.
This device belongs to the SN74LVTH1850A series, which focuses on low-voltage CMOS technology optimized for high-speed operation. The ABT family provides advanced features for system testability, making it distinct from standard logic families by integrating specific scan chain structures directly into the bus transceiver architecture.
Check for direct substitutes within the SN74LVTH1850A family or compatible ABT devices with identical pinouts and 20-bit width. Verify that any alternative maintains the same 64-pin LQFP footprint and 3.3V operating voltage to ensure mechanical and electrical compatibility without redesigning the PCB layout.
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