FBA04HA600VS-00

Chip Ferrite Bead Overview

The FBA04HA600VS-00 is a leaded ferrite bead inductor from the Taiyo Yuden FB series. It features an axial package with dimensions of 3.5 mm diameter by 6.00 mm length. The component provides an impedance of 60 Ohms at a test frequency of 100 MHz. It supports a maximum DC current of 7 A and has a maximum DC resistance of 10 mOhms. The operating temperature range spans from -25°C to +85°C.

Chip Ferrite Bead Feature Summary

• Provides high-frequency noise suppression through axial ferrite bead construction
• Designed for through-hole mounting applications
• Capable of handling high direct current loads

Chip Ferrite Bead Applications

• High-current power line filtering
• Electromagnetic interference suppression in electronic circuits
• Signal integrity management in axial leaded assemblies

Chip Ferrite Bead Procurement Notes

Verify component status as this part is listed as obsolete or discontinued by the manufacturer. Confirm availability through secondary market distributors if sourcing is required. Ensure compatibility with existing axial footprint designs before procurement planning.

Chip Ferrite Bead Selection Notes

Select this component when axial form factor and 60 Ohm impedance at 100 MHz are required. Verify that the 7 A current rating meets circuit demands. Check that the 10 mOhm DC resistance aligns with voltage drop constraints. Confirm thermal limits suit the operational environment.

Chip Ferrite Bead Part Context

This ferrite bead belongs to the FB series, specifically the A type leaded inductors. It shares physical characteristics with similar models like FBA04HA600VB-00 but differs in packaging suffixes. The product falls under the broader category of ferrites and filters within Taiyo Yuden's portfolio.

Chip Ferrite Bead Replacement Considerations

Direct substitutes include FBA04HA600VB-00 and FBA04VA600VS-00. Verify impedance values and physical dimensions match before substitution. Note that some variants may have different packaging or slight dimensional variations.