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SN74ABTH182646APM is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN-TEST-DEV/TXRX 64-LQFP. Review the specifications below when checking this part for your BOM.
The SN74ABTH182646APM is an 18-bit scan test device with bus transceivers and registers, part of the Texas Instruments SCOPE family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). The device features multiplexed transmission of stored and real-time data using D-type flip-flops. It operates from -40°C to +85°C in a 64-pin LQFP package.
Verify that the component matches the specific 'PM' package designation for the 64-pin Thin Quad Flat configuration. Confirm the manufacturer is Texas Instruments and the full part number includes the 'SN74' prefix. Ensure the device meets the commercial temperature range requirements (-40°C to +85°C) as specified in the datasheet.
Select this device when IEEE 1149.1-1990 compliance is required for board-level testing. It is suitable for applications needing 18-bit bidirectional data transfer with registered storage capabilities. Consider the integrated series resistors on B-port outputs if external termination components are undesirable.
This component belongs to the Texas Instruments SCOPE family of testability products. It is designed to facilitate the testing of complex digital systems by integrating standard boundary-scan logic with functional bus transceiver capabilities. The device allows simultaneous normal operation and test access without interfering with data flow.
The SN74ABTH18646A is a compatible alternative within the same family, differing primarily in the absence of the specific B-port series resistor feature found in the 182646 variant.
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SN74ABTH182646APM is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN-TEST-DEV/TXRX 64-LQFP. Review…
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