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SN74LV00APWG4 is listed in the Inverter Gates range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC GATE NAND 4CH 2-INP 14TSSOP. Review the specifications below when checking this part for your BOM.
The SN74LV00APWG4 is a quadruple 2-input positive-NAND gate from the Texas Instruments SN74LV00A series. It operates within a supply voltage range of 2 V to 5.5 V and supports mixed-mode voltage operation on all ports. The device features Ioff circuitry for partial power-down compatibility, preventing backflow current when powered down. It provides ESD protection exceeding 2000 V via the human-body model and latch-up performance exceeding 250 mA per JESD 17 standards.
Verify the specific package type and environmental compliance status against the manufacturer's latest orderable addendum before procurement. Confirm that the G4 suffix aligns with required RoHS directives and lead finish specifications for the target assembly process. Ensure design validation accounts for the recommended operating conditions regarding input transition rates and load capacitance limits.
Select this component for designs requiring low drive CMOS characteristics to minimize output ringing and overshoot. It is suitable for bus interface applications where slow edge rates are beneficial. Verify that the 2-V to 5.5-V operating range matches the system power rails and that the TSSOP-14 package fits the available board space constraints.
This part belongs to the SNx4LV00A family of quadruple 2-input NAND gates manufactured by Texas Instruments. The family includes variants such as SN74LV00ADBR and SN74LV00ADR, offering different packaging options like SSOP and SOIC. The SN74LV00A series is designed for general-purpose logic applications requiring wide voltage operation and robust noise immunity.
SN74LV00APWR
The Ioff circuitry disables the outputs when VCC is at 0 V, preventing damaging current backflow through the device during partial power-down states.
The device exceeds 2000 V under the Human-Body Model test (per ANSI/ESDA/JEDEC JS-001) and 1000 V under the Charged-Device Model test.
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