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— IC芯片 | 连接器 | 传感器 | 被动器件 —

Specialty Logic ICs are designed to provide an application specific logic output type such as BCD rate multiplication, addressable scan port, bus termination array, CML driver, comparator, ABT scan test, binary full adder, complimentary pair plus inverter, configurable buffer, contact bounce eliminator, crystal oscillator, delay element, differential receiver, LVTTL-to-GTLP transceiver, memory decoder, power good detector, and frequency divider.
| Select products | Mfr | Description | Package | Supplier Device Package | Mounting Type | Series | Operating Temperature |
|---|---|---|---|---|---|---|---|
![]() SN74LVTH182502APMR $7.39 | Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | Tape & Reel (TR),Cut Tape (CT),Bulk | 64-LQFP (10x10) | Surface Mount | 74LVTH | -40°C ~ 85°C |
![]() SN74LVTH182504APM $4.19 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Bulk,Tray | 64-LQFP (10x10) | Surface Mount | 74LVTH | -40°C ~ 85°C |
![]() SN74LVTH182512DGGR $7.05 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | Tape & Reel (TR),Cut Tape (CT) | 64-TSSOP | Surface Mount | 74LVTH | -40°C ~ 85°C |
![]() SN74LVTH182646APM $10.42 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Bulk,Tray | 64-LQFP (10x10) | Surface Mount | 74LVTH | -40°C ~ 85°C |
![]() SN74LVTH182652APM $10.42 | Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | Bulk,Tray | 64-LQFP (10x10) | Surface Mount | 74LVTH | -40°C ~ 85°C |
![]() SN74LVTH18504APM $5.57 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Bulk,Tray | 64-LQFP (10x10) | Surface Mount | 74LVTH | -40°C ~ 85°C |
![]() SN74LVTH18504APMR $7.39 | Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | Tape & Reel (TR),Cut Tape (CT),Bulk | 64-LQFP (10x10) | Surface Mount | 74LVTH | -40°C ~ 85°C |
![]() SN74LVTH18646APM $12.34 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Bulk,Tray | 64-LQFP (10x10) | Surface Mount | 74LVTH | -40°C ~ 85°C |