1N4624C-1

Overview

The Microchip Technology 1N4624C-1 is a single Zener diode rated for 500 mW power dissipation. It provides a nominal Zener voltage of 4.7 V with a tolerance of ±5%. The device operates within an extended temperature range from -65°C to +175°C and utilizes a DO-35 axial leaded package. Key electrical characteristics include a maximum reverse leakage current of 5 µA at 3 V, a Zener impedance of 1550 Ohms, and a forward voltage of 1.1 V at 200 mA.

Feature Summary

• Metallurgically bonded glass construction for high reliability
• Qualified per MIL-PRF-19500/435 standards
• Extended operating temperature range up to +175°C

Applications

• High-reliability voltage regulation circuits
• Military aerospace electronic systems
• Temperature-compensated reference applications

Procurement Notes

Verify the specific suffix 'C' against official Microchip documentation to confirm exact testing or binning specifications, as standard datasheets often list the base series without this suffix. Confirm RoHS compliance status, as military-grade variants may differ from commercial equivalents. Ensure the procurement channel provides traceability documentation required for qualified components.

Selection Notes

Select this component when a stable 4.7 V reference is required in harsh environments. The DO-35 package suits through-hole designs. Consider the 1550 Ohm impedance for low-current applications. Verify that the ±5% tolerance meets circuit requirements compared to tighter tolerance alternatives like the JANTXV series if precision is critical.

Part Context

This part belongs to the 1N4614-1 through 1N4627-1 series of 500 mW Zener diodes manufactured by Microchip Technology. These devices are designed for high-reliability applications and are available in various qualification levels including JAN, JANTX, JANTXV, and JANS. The series features internal metallurgical bonds and is registered with JEDEC.

Replacement Considerations

Publicly confirmed substitute part numbers for the 1N4624C-1 are not available in the provided source material.