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CD74HCT4511E is listed in the Display Drivers range at ChipApex. The manufacturer field lists Harris Corporation. Its product description is SEVEN SEGMENT DECODER/DRIVER. Review the specifications below when checking this part for your BOM.
The CD74HCT4511E is a BCD to seven-segment latch/decoder/driver manufactured by Harris Corporation. It belongs to the HCT CMOS logic series, designed for driving common-cathode LED displays. The device features four address inputs (A, B, C, D), a latch enable input (LE), a ripple blanking input (BI), and a lamp test input (LT). It operates with a supply voltage range of 2.0 V to 6.0 V and supports a wide operating temperature range from -40 °C to +85 °C. The component is housed in a 16-pin DIP package.
Verify the manufacturer origin, as Harris Corporation's logic assets were acquired by Texas Instruments. Confirm that the specific 'E' suffix corresponds to the PDIP-16 package variant. Check RoHS compliance status, as older Harris production may not meet current environmental standards. Ensure the supplier provides valid traceability for legacy components.
Select this component when a BCD-to-seven-segment decoder with an internal latch is required for HCT logic level interfacing. It is suitable for applications needing direct LED drive without external transistors. Consider the HCT series compatibility with TTL inputs if interfacing with legacy digital circuits. Verify package availability and thermal requirements for the intended environment.
The CD74HCT4511E is part of the standard 74HCT logic family, which offers high-speed operation compatible with TTL inputs while maintaining CMOS low-power characteristics. This specific device focuses on display driving applications, combining decoding, latching, and output buffering in a single integrated circuit. It represents a legacy component from Harris Corporation before industry consolidation.
Compatible substitutes include the SN74HCT4511 from Texas Instruments or the 74HCT4511 from Nexperia. These alternatives maintain identical pinouts and logical functionality. Verify that replacement sources confirm the same HCT input thresholds and output drive capabilities.
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