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CY29FCT818CTPC is listed in the Shift Registers range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC DIAGNOSTIC SCN REG 3ST 24DIP. Review the specifications below when checking this part for your BOM.
The CY29FCT818CTPC is a diagnostic scan register from the Texas Instruments FCT logic series. It features tri-state outputs and operates within a single circuit configuration. The component utilizes a 24-pin DIP package for through-hole mounting. Key electrical specifications include a propagation delay of 7.2 ns and a fixed operating voltage of 5 V. It supports nine input lines and nine output lines, functioning as a universal shift register with diagnostic capabilities for system verification.
Verify availability status carefully as this specific part number may be obsolete or discontinued by the manufacturer. Confirm if the SOIC-24 surface mount variant (CY29FCT818CTSOCT) serves as a direct functional replacement in your design. Ensure the DIP package requirement is strictly necessary before sourcing, as inventory for legacy packages is often limited. Cross-reference datasheets to confirm pin compatibility.
Select this component when a diagnostic scan register with tri-state outputs is required for 5 V logic systems. Consider the CY29FCT818CTSOCT if surface mount technology is preferred over the DIP package. Verify that the 7.2 ns propagation delay meets timing requirements. Ensure the nine-bit width aligns with data path needs. Check for end-of-life notices before finalizing the bill of materials.
This device belongs to the Texas Instruments CY29FCT818T family of logic ICs. It is categorized under shift registers within the broader FCT logic series. The component is designed for high-speed digital applications requiring diagnostic features. It shares functional similarities with other pipeline registers in the same series but offers specific scan chain capabilities.
The CY29FCT818CTSOCT is listed as a similar substitute part. Verify package differences between the DIP and SOIC formats. Confirm functional equivalence regarding tri-state outputs and diagnostic modes.
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