Field Programmable Gate Array EPF10K30EQI208-2N product image

EPF10K30EQI208-2N

  • Description:IC FPGA 147 I/O 208QFP
  • Series:FLEX-10KE®

SKU:768b24354200 Category: Brand:

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EPF10K30EQI208-2N is listed in the Field Programmable Gate Array range at ChipApex. The manufacturer field lists Altera. Its product description is IC FPGA 147 I/O 208QFP. Review the specifications below when checking this part for your BOM.

Field Programmable Gate Array specifications for EPF10K30EQI208-2N

  • Description:IC FPGA 147 I/O 208QFP
  • Series:FLEX-10KE®
  • Mfr:Altera
  • Package:Tray
  • Number of LABs/CLBs:216
  • Number of Logic Elements/Cells:1728
  • Total RAM Bits:24576
  • Number of I/O:147
  • Voltage - Supply:2.375V ~ 2.625V
  • Mounting Type:Surface Mount
  • Operating Temperature:-40°C ~ 85°C (TA)
  • Package / Case:208-BFQFP
  • Supplier Device Package:208-PQFP (28x28)
  • Number of Gates:119000

Field Programmable Gate Array datasheet and documents for EPF10K30EQI208-2N

EPF10K30EQI208-2N

Field Programmable Gate Array Overview

The EPF10K30EQI208-2N is an embedded programmable logic device from the Altera FLEX 10KE family, housed in a 208-pin PQFP package. It features 1,728 logic elements organized into 216 LABs and includes 6 Embedded Array Blocks (EABs) providing 12 kbit of total RAM capacity. The device operates at a maximum system frequency of 145 MHz for memory read cycles and supports a 2.5 V supply voltage with an industrial temperature range of 0°C to +70°C. It integrates built-in JTAG boundary-scan test circuitry compliant with IEEE Std. 1149.1-1990.

Field Programmable Gate Array Feature Summary

  • FLEX 10KE Architecture: Combines general-purpose logic arrays with embedded memory blocks for System-on-a-Programmable-Chip integration.
  • Embedded Memory: Six EABs provide 12,288 bits of RAM/ROM/FIFO capability without reducing logic capacity.
  • High-Speed Interconnect: Utilizes FastTrack continuous routing structure with dedicated carry and cascade chains for arithmetic functions.
  • JTAG Compliance: Includes built-in IEEE Std. 1149.1-1990 boundary-scan test circuitry available without consuming device logic.

Field Programmable Gate Array Applications

  • Complex digital logic implementation requiring embedded memory resources.
  • Systems supporting PCI Local Bus Specification Revision 2.2.
  • Applications requiring in-circuit reconfigurability via external configuration devices or JTAG port.

Field Programmable Gate Array Procurement Notes

Verify component authenticity through authorized distributors as this part number may be subject to lifecycle restrictions. Confirm that the specific ordering suffix corresponds to the required speed grade and temperature range. Ensure compatibility with existing PCB footprints for the 208-pin PQFP package before procurement.

Field Programmable Gate Array Selection Notes

Select this device when 1,728 LEs and 12 kbit of embedded memory are sufficient for the design. Compare against EPF10K30 variants if different package types or voltage levels are required. Consider the -2 speed grade performance limits for timing closure in high-frequency designs.

Field Programmable Gate Array Part Context

This component belongs to the FLEX 10KE series, an evolution of the original FLEX 10K family offering enhanced density and power efficiency. It serves as a bridge between standard PLDs and higher-density FPGA families, allowing designers to integrate microcontroller-like functions within programmable logic fabric.

Field Programmable Gate Array Replacement Considerations

Direct pin-compatible replacements within the same package and voltage domain should be sought from the FLEX 10K family. Verify logical equivalence for any cross-family migration to ensure resource availability matches design requirements.

Field Programmable Gate Array FAQ

What is the total embedded memory capacity?

The device contains 6 Embedded Array Blocks (EABs), providing a total of 12,288 bits (12 kbit) of RAM/ROM/FIFO capacity.

Does the device support JTAG testing?

Yes, it includes built-in Joint Test Action Group (JTAG) boundary-scan test circuitry compliant with IEEE Std. 1149.1-1990, which does not consume device logic resources.

What is the operating voltage range?

The device operates at a nominal 2.5 V supply voltage.

EPF10K30EQI208-2NEPF10K30EQI208-2N

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