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EPF10K30EQI208-2N is listed in the Field Programmable Gate Array range at ChipApex. The manufacturer field lists Altera. Its product description is IC FPGA 147 I/O 208QFP. Review the specifications below when checking this part for your BOM.
The EPF10K30EQI208-2N is an embedded programmable logic device from the Altera FLEX 10KE family, housed in a 208-pin PQFP package. It features 1,728 logic elements organized into 216 LABs and includes 6 Embedded Array Blocks (EABs) providing 12 kbit of total RAM capacity. The device operates at a maximum system frequency of 145 MHz for memory read cycles and supports a 2.5 V supply voltage with an industrial temperature range of 0°C to +70°C. It integrates built-in JTAG boundary-scan test circuitry compliant with IEEE Std. 1149.1-1990.
Verify component authenticity through authorized distributors as this part number may be subject to lifecycle restrictions. Confirm that the specific ordering suffix corresponds to the required speed grade and temperature range. Ensure compatibility with existing PCB footprints for the 208-pin PQFP package before procurement.
Select this device when 1,728 LEs and 12 kbit of embedded memory are sufficient for the design. Compare against EPF10K30 variants if different package types or voltage levels are required. Consider the -2 speed grade performance limits for timing closure in high-frequency designs.
This component belongs to the FLEX 10KE series, an evolution of the original FLEX 10K family offering enhanced density and power efficiency. It serves as a bridge between standard PLDs and higher-density FPGA families, allowing designers to integrate microcontroller-like functions within programmable logic fabric.
Direct pin-compatible replacements within the same package and voltage domain should be sought from the FLEX 10K family. Verify logical equivalence for any cross-family migration to ensure resource availability matches design requirements.
The device contains 6 Embedded Array Blocks (EABs), providing a total of 12,288 bits (12 kbit) of RAM/ROM/FIFO capacity.
Yes, it includes built-in Joint Test Action Group (JTAG) boundary-scan test circuitry compliant with IEEE Std. 1149.1-1990, which does not consume device logic resources.
The device operates at a nominal 2.5 V supply voltage.
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