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SN74BCT8374ANT is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE W/FF 24-DIP. Review the specifications below when checking this part for your BOM.
The SN74BCT8374ANT is a specialty logic device manufactured by Texas Instruments, classified as an octal D-type edge-triggered flip-flop with scan test capabilities. It operates within a supply voltage range of 4.5 V to 5.5 V and features three-state outputs. The component utilizes BICMOS technology and is housed in a 24-pin PDIP package. Designed for through-hole mounting, it supports non-inverting logic functions and is suitable for industrial temperature ranges from 0°C to +70°C.
Verify the specific suffix 'ANT' against official Texas Instruments documentation to confirm pinout compatibility and electrical specifications. Ensure the procurement source provides valid RoHS compliance records. Confirm that the 24-pin PDIP package matches the target PCB footprint requirements before finalizing orders.
Select this component when design requirements demand integrated scan test features alongside standard octal flip-flop operations. Consider the 24-pin PDIP package constraint for through-hole assembly processes. Evaluate the BCT series performance characteristics against system timing budgets to ensure adequate propagation delay margins for the intended application speed.
This device belongs to the Texas Instruments SN74BCT family, which combines the high-speed performance of BCT logic with low power dissipation characteristics. The SN74BCT8374ANT specifically addresses applications requiring boundary scan or specialized test access port implementations within complex digital logic designs.
Consult official substitution guides for compatible variants such as the SN74BCT8374N or SN74BCT8374ADW. Verify functional equivalence regarding scan test pin configurations and output drive strengths before implementing any alternative components in existing designs.
It serves as a specialty logic device featuring an octal D-type edge-triggered flip-flop with integrated scan test capabilities.
Yes, the SN74BCT8374ANT includes three-state outputs to manage bus loading effectively.
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