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SNJ54ABT8652JT is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is SCAN TEST DEVICES WITH OCTAL BUS. Review the specifications below when checking this part for your BOM.
The SNJ54ABT8652JT is a military-grade scan test device from Texas Instruments, featuring octal bus transceivers and registers. It operates within an extended temperature range of -55°C to 125°C and utilizes a 28-lead Ceramic Dual In-Line Package (CDIP). This component belongs to the SCOPE testability integrated-circuit family, designed for high-reliability applications requiring robust data handling and testing capabilities in harsh environments.
Verify the specific suffix 'JT' corresponds to the ceramic dual in-line package and military rating. Confirm RoHS compliance status as historical military parts may differ from standard commercial offerings. Ensure the supplier provides traceability documentation suitable for defense or aerospace procurement requirements.
Select this component when designing systems that require integrated scan test structures for built-in self-test (BIST) capabilities. The CDIP package is suitable for high-reliability soldering processes. Consider the octal configuration if multiple parallel data lines require simultaneous buffering and registration during test modes.
This part is part of the ABT series, known for advanced bipolar technology offering high speed and low power consumption. It falls under the broader category of bus transceivers but is specialized for testability features rather than general-purpose data transfer.
The SN74ABT8652 is the commercial-grade equivalent. Verify if the commercial temperature range and packaging options meet the system requirements before substituting the military-grade SNJ variant.
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