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TLC546IN is listed in the Analog To Digital Converters (ADC) range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC 8 BIT 40 KSPS ADC S/O 28-DIP. Review the specifications below when checking this part for your BOM.
The TLC546IN is an 8-bit successive-approximation analog-to-digital converter (ADC) manufactured by Texas Instruments in a 28-pin plastic DIP package. It features an on-chip 20-channel analog multiplexer, allowing sampling of 19 external inputs or an internal self-test voltage. The device operates with a maximum sampling rate of 40 kSPS and a conversion time of 17 µs. It supports serial interface via CS, I/O CLOCK, SYSTEM CLOCK, and ADDRESS INPUT pins. Electrical characteristics include a total unadjusted error of ±0.5 LSB max and power dissipation of 15 mW max.
Verify the specific suffix 'IN' corresponds to the industrial temperature range (-40°C to 85°C) and 28-pin PDIP package as defined in the datasheet. Confirm that the ordering information matches the manufacturer's current production status, as legacy components may have availability variations.
Select the TLC546IN over the TLC545 variant when a lower maximum sampling rate of 40 kSPS is sufficient for the application. Ensure the system clock frequency does not exceed 2.1 MHz and the I/O clock frequency remains within the 1.1 MHz limit specified for this model.
This component belongs to the TLC54x family of 8-bit A/D converters. It is electrically compatible with the TLC540 and TLC1540 families regarding timing and control signals. The TLC546 differs from the TLC545 primarily in its slower conversion speed and maximum operating frequencies.
The TLC545IN serves as a higher-speed alternative within the same package and pinout configuration. Verify functional compatibility if substituting, noting the difference in maximum sampling rates and clock requirements.
The maximum sampling rate for the TLC546 is 40,000 samples per second (40 kSPS).
The device includes an on-chip 20-channel analog multiplexer, providing access to 19 external analog inputs plus one internal self-test channel.
The total unadjusted error is specified as a maximum of ±0.5 LSB over the full operating temperature range.
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