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1N3912AR is listed in the Single Diodes range at ChipApex. The manufacturer field lists Microchip Technology. Its product description is DIODE STD REV 300V 50A DO203AB. Review the specifications below when checking this part for your BOM.
The Microchip Technology 1N3912AR is a high-reliability fast recovery rectifier diode designed for demanding environments. It features a single silicon element with a maximum average forward rectified current of 30A and a repetitive peak reverse voltage (VRRM) of 300V. The device utilizes a stud mount configuration within a hermetically sealed DO-5 package, ensuring robust thermal management and environmental protection. Qualified per MIL-PRF-19500/308, it supports junction temperatures up to 150°C and exhibits a typical reverse recovery time of 150ns.
Verify the specific suffix 'AR' against the manufacturer's official datasheet to confirm exact qualification levels and testing parameters. Ensure that the ordering information matches the required military specifications and package type. Confirm availability through authorized channels as this component may be produced to order.
Select the 1N3912AR when a hermetically sealed, fast recovery rectifier is required for high-reliability applications. Consider its 30A current rating and 300V blocking capability alongside the stud mount form factor. Verify compatibility with existing thermal management solutions due to the metal case connection.
This component belongs to the 1N39xx series of high-reliability fast recovery rectifiers manufactured by Microchip Technology. The series includes variants with different voltage ratings and suffixes indicating specific qualification or packaging options. The 1N3912AR represents a specific configuration within this family designed for ruggedized electronics.
Substitutes must match the 30A current rating, 300V VRRM, and fast recovery characteristics. Verify that any alternative component offers equivalent hermetic sealing and meets the same MIL-PRF-19500/308 qualification standards to ensure system reliability.
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