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DG411HSDY-E3 is listed in the Analog Switches, Multiplexers, Demultiplexers range at ChipApex. The manufacturer field lists Vishay Siliconix. Its product description is IC SWITCH SPST-NCX4 35OHM 16SOIC. Review the specifications below when checking this part for your BOM.
The DG411HSDY-E3 is a precision monolithic quad SPST CMOS analog switch manufactured by Vishay Siliconix. It operates within a -40 °C to +85 °C temperature range and utilizes a 16-pin Narrow SOIC package. The device supports dual supply voltages up to ±20 V (44 V total) or single supplies up to 44 V, with an analog signal range of ±15 V. Key electrical parameters include a maximum on-resistance of 35 Ω, a typical turn-on time of 68 ns, and ultra-low power dissipation of 0.35 µW. It features TTL/CMOS compatibility and break-before-make switching action.
Verify the specific ordering suffix against official documentation to confirm package type and tape/reel specifications. Ensure the component meets RoHS requirements as indicated by the E3 suffix. Cross-reference the manufacturer part number with authorized distributors to confirm current availability and lead times before finalizing procurement plans.
Select this component for applications requiring high-speed switching with low error rates in portable or battery-powered environments. Consider the 35 Ω on-resistance and 68 ns turn-on time for signal integrity requirements. Verify that the 16-pin Narrow SOIC package dimensions fit the target PCB layout constraints.
This component belongs to the DG411HS series of precision monolithic quad SPST CMOS analog switches. The series is designed for high-speed, low-error switching of precision analog signals. The DG411 variant specifically responds to control logic where a logic '0' turns the switch on and a logic '1' turns it off.
DG411HSDJ-E3
The absolute maximum rating for the voltage difference between V+ and V- is 44 V.
Yes, the device supports single supply capability in addition to dual supply operation.
The typical turn-on time (tON) is 68 ns under standard test conditions.
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