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S26KL256SDABHM030 is listed in the Memory IC range at ChipApex. The manufacturer field lists Cypress Semiconductor Corp. Its product description is IC FLASH 256MBIT PAR 24FBGA. Review the specifications below when checking this part for your BOM.
The S26KL256SDABHM030 is a 256-Mb (32-MB) HYPERFLASH™ NOR flash memory device manufactured by Infineon Technologies. It utilizes the HYPERBUS™ interface with an 8-bit data bus and supports DDR transfers at clock rates up to 166 MHz at 1.8 V, achieving sustained read throughput of 333 MBps. The device features a 96-ns initial random read access time and operates within an extended temperature range of -40°C to +125°C. It is housed in a 24-ball FBGA package.
Verify that the specific ordering suffix matches the required voltage domain and temperature grade. Confirm the package variant corresponds to the intended PCB footprint. Ensure compatibility with the host system's HYPERBUS controller signals. Validate RoHS compliance status against current regulatory requirements. Cross-reference the manufacturer's latest datasheet revision for any pinout or electrical specification updates.
Select this component when high-speed read performance is critical for system boot times or large data retrieval. Choose this part if the application requires operation in extreme temperatures up to 125°C. Consider this device for designs needing integrated error correction without external processing overhead. Evaluate the 24-ball FBGA package constraints against available board space. Compare power consumption profiles against other NOR flash options for battery-operated systems.
This device belongs to the HYPERFLASH family, which combines MIRRORBIT technology with the HYPERBUS interface. The family includes various densities and voltage variants. The 'KL' designation typically indicates standard commercial/industrial grades, while 'KS' denotes automotive grades. This specific model represents the 256-Mb density option within the broader portfolio.
S26KS256SDABHI030
DCARS allows independent phase shifting of the RWDS signal relative to the clock inputs, centering the read data strobe within the valid data window to optimize setup and hold times.
Programming the same half-page more than once without an intervening erase disables the ECC functionality for that half-page because the ECC syndrome becomes invalid.
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