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SN74BCT8244ANT is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE BUFF 24-DIP. Review the specifications below when checking this part for your BOM.
The SN74BCT8244ANT is an octal buffer and line driver featuring integrated scan test capabilities compliant with IEEE Standard 1149.1-1990. It operates within a supply voltage range of 4.5 V to 5.5 V and supports a commercial temperature range of 0°C to 70°C. The device provides two groups of four non-inverting buffers with tri-state outputs, controlled by separate output-enable inputs (1OE, 2OE). It includes a 4-wire Test Access Port (TAP) interface consisting of TDI, TDO, TMS, and TCK terminals for boundary-scan testing.
Verify that the ordering suffix 'ANT' corresponds to the specific plastic DIP package variant documented in the official datasheet. Confirm the component meets the specified commercial temperature range requirements for your application environment. Ensure compatibility with standard 300-mil DIP footprints if utilizing legacy board designs.
Select this component when design requirements include both standard octal buffering functions and built-in self-test capabilities. It serves as a functional equivalent to standard BCT244 devices in normal mode while adding JTAG compliance. Consider its use in systems requiring simplified manufacturing test procedures without external test equipment interfaces.
This device belongs to Texas Instruments' SCOPE family of testability products. It is designed to facilitate the testing of complex circuit-board assemblies through standardized boundary-scan architecture. The part integrates standard logic buffering with dedicated test registers, including an instruction register and multiple data registers for comprehensive system diagnostics.
The SN74BCT8244A is functionally equivalent to the SN54BCT8244A, differing primarily in operating temperature specifications. Verify pinout compatibility with standard octal buffer packages before substitution.
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