Specialty Logic SN74BCT8244ANT product image

SN74BCT8244ANT

$5.12
  • Description:IC SCAN TEST DEVICE BUFF 24-DIP
  • Series:74BCT
  • Mfr:Texas Instruments
  • Package:Tube,Tube

SKU:177dc85b885b Category: Brand:

  
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SN74BCT8244ANT is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE BUFF 24-DIP. Review the specifications below when checking this part for your BOM.

Specialty Logic specifications for SN74BCT8244ANT

  • Description:IC SCAN TEST DEVICE BUFF 24-DIP
  • Series:74BCT
  • Mfr:Texas Instruments
  • Package:Tube,Tube
  • Logic Type:Scan Test Device with Buffers
  • Supply Voltage:4.5V ~ 5.5V
  • Number of Bits:8
  • Operating Temperature:0°C ~ 70°C
  • Mounting Type:Through Hole
  • Package / Case:24-DIP (0.300", 7.62mm)
  • Supplier Device Package:24-PDIP
  • Grade:-
  • Qualification:-

Specialty Logic datasheet and documents for SN74BCT8244ANT

SN74BCT8244ANT

Specialty Logic Overview

The SN74BCT8244ANT is an octal buffer and line driver featuring integrated scan test capabilities compliant with IEEE Standard 1149.1-1990. It operates within a supply voltage range of 4.5 V to 5.5 V and supports a commercial temperature range of 0°C to 70°C. The device provides two groups of four non-inverting buffers with tri-state outputs, controlled by separate output-enable inputs (1OE, 2OE). It includes a 4-wire Test Access Port (TAP) interface consisting of TDI, TDO, TMS, and TCK terminals for boundary-scan testing.

Specialty Logic Feature Summary

  • Integrates an IEEE 1149.1-1990 compliant Test Access Port (TAP) controller for board-level testing
  • Supports parallel-signature analysis (PSA) and pseudo-random pattern generation (PRPG)
  • Maintains normal logic functionality while the test circuitry remains inactive
  • Features internal pullup resistors on all test access port terminals

Specialty Logic Applications

  • Boundary-scan testing of complex circuit-board assemblies
  • Self-test operations for digital logic circuits
  • Input data sampling and output signal toggling during manufacturing tests

Specialty Logic Procurement Notes

Verify that the ordering suffix 'ANT' corresponds to the specific plastic DIP package variant documented in the official datasheet. Confirm the component meets the specified commercial temperature range requirements for your application environment. Ensure compatibility with standard 300-mil DIP footprints if utilizing legacy board designs.

Specialty Logic Selection Notes

Select this component when design requirements include both standard octal buffering functions and built-in self-test capabilities. It serves as a functional equivalent to standard BCT244 devices in normal mode while adding JTAG compliance. Consider its use in systems requiring simplified manufacturing test procedures without external test equipment interfaces.

Specialty Logic Part Context

This device belongs to Texas Instruments' SCOPE family of testability products. It is designed to facilitate the testing of complex circuit-board assemblies through standardized boundary-scan architecture. The part integrates standard logic buffering with dedicated test registers, including an instruction register and multiple data registers for comprehensive system diagnostics.

Specialty Logic Replacement Considerations

The SN74BCT8244A is functionally equivalent to the SN54BCT8244A, differing primarily in operating temperature specifications. Verify pinout compatibility with standard octal buffer packages before substitution.

SN74BCT8244ANTSN74BCT8244ANT
$5.12
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