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TLV6700QDDCRQ1 is listed in the Comparators range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC COMPARATOR 2 WINDW SOT23-THIN. Review the specifications below when checking this part for your BOM.
The TLV6700QDDCRQ1 is an automotive-grade window comparator featuring two high-accuracy comparators with a 400-mV internal reference. It operates on a supply voltage range of 1.8 V to 18 V and includes built-in hysteresis for stable operation. The device provides two open-drain outputs rated up to 18 V, capable of sinking 40 mA. It is qualified under AEC-Q100 standards for Grade 1 applications, supporting junction temperatures from -40°C to +125°C.
Verify the specific suffix 'DDCR' corresponds to the SOT-23-6 package variant required for your PCB layout. Confirm that the Q1 designation aligns with your project's automotive qualification requirements. Ensure pull-up voltages do not exceed the 18 V output rating. Validate thermal performance within the specified operating temperature range during final design review.
Select this component when a dual-channel window detection function is needed in space-constrained designs. It is suitable for monitoring rails where undervoltage and overvoltage conditions must be detected simultaneously. Consider the low quiescent current for battery-powered applications. Verify that the 400-mV internal reference meets the sensitivity requirements of the monitored circuit.
This part belongs to the TLV6700-Q1 family of micropower window comparators. It shares functional similarities with the industrial TLV6700 but offers extended reliability specifications for automotive use. The DDCR suffix indicates surface-mount packaging in a thin SOT-23-6 case, facilitating compact board integration compared to larger packages.
The industrial version TLV6700DDCR offers identical electrical characteristics but lacks automotive qualification. For higher voltage ranges, consider the TLV6710 series. Single-channel alternatives include the TLV6703 or TLV6713 families.
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